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PEEK: One-Step-Look-Ahead Exposure Bias Correction for Diffusion Sampling

Summary

PEEK is a training-free deterministic sampler plugin that mitigates exposure bias in diffusion models by performing a one-step look-ahead evaluation and interpolating predictions, achieving up to 49.3% FID improvement on multiple models.

SourcearXiv Computer VisionAuthor: Yunwei Bai, Ying Kiat Tan, Tsuhan Chen
PEEK: One-Step-Look-Ahead Exposure Bias Correction for Diffusion Sampling
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[Submitted on 20 Oct 2026]

Title:PEEK: One-Step-Look-Ahead Exposure Bias Correction for Diffusion Sampling

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Abstract:Diffusion image generators are successful due to accurate denoising networks and strong numerical samplers. Yet the two components are not fully matched. During sampling, the denoiser predicts for the next step based on flawed input that differ much from the real data. This train-test gap, or exposure bias, caps image generation quality (i.e., blurry, lacking in details or awkward in shape). To mitigate the problem, we propose PEEK, a novel training-free deterministic sampler plugin. At each eligible denoising step, PEEK first performs a provisional one-step update, evaluates the denoiser once at the look-ahead state, and interpolates it with the one-step-later prediction to form the next noisy state. By taking the additional step, we obtain a generally more-image-like prediction from the higher-signal noisy state, mitigating the exposure bias. To optimize the interpolation positions, PEEK searches for an interpolation schedule search made efficient by the prefix and baseline noise-schedule-rebasing caches. On 8 pixel-space and latent-space diffusion models with unconditional, label-guided, and text-guided settings across various output resolutions, PEEK consistently improves over NFE-matched baselines, with FID improvements up to 49.3\% at minimal extra computation cost (e.g., the one-time-per-model calibration takes at most 2.2 minutes across our experiments.). Project website is at this https URL.

Comments: Accepted to Neurips 2026

Subjects:

Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI)

Cite as: arXiv:2611.05407 [cs.CV]

(or arXiv:2611.05407v1 [cs.CV] for this version)

https://doi.org/10.48550/arXiv.2611.05407

arXiv-issued DOI via DataCite

Submission history

From: Yunwei Bai [view email] [v1] Tue, 20 Oct 2026 23:05:10 UTC (12,579 KB)

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Key points

  • PEEK is a training-free plugin that can be integrated into existing deterministic samplers.
  • It mitigates exposure bias via a one-step look-ahead and an efficient interpolation schedule search.
  • Experiments on 8 diffusion models show up to 49.3% FID improvement with minimal calibration cost.

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